11. Reliability Assessment

  1. Weifeng Liu and
  2. Michael Pecht

Published Online: 28 JAN 2005

DOI: 10.1002/0471648272.ch11

IC Component Sockets

IC Component Sockets

How to Cite

Liu, W. and Pecht, M. (2004) Reliability Assessment, in IC Component Sockets, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/0471648272.ch11

Publication History

  1. Published Online: 28 JAN 2005
  2. Published Print: 11 MAR 2004

ISBN Information

Print ISBN: 9780471460503

Online ISBN: 9780471648277

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Keywords:

  • contact theory;
  • reliability prediction;
  • high socket reliability

Summary

This chapter contains sections titled:

  • Contact Resistance Theory

  • Contact Reliability Theory

  • Intermittences

  • Socket Reliability Prediction

  • Achieving Socket Reliability

  • Summary

  • References