9. Failure Modes and Mechanisms

  1. Weifeng Liu and
  2. Michael Pecht

Published Online: 28 JAN 2005

DOI: 10.1002/0471648272.ch9

IC Component Sockets

IC Component Sockets

How to Cite

Liu, W. and Pecht, M. (2004) Failure Modes and Mechanisms, in IC Component Sockets, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/0471648272.ch9

Publication History

  1. Published Online: 28 JAN 2005
  2. Published Print: 11 MAR 2004

ISBN Information

Print ISBN: 9780471460503

Online ISBN: 9780471648277

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Keywords:

  • failure mechanisms;
  • dry oxidation;
  • stress corrosion cracking (SCC)

Summary

This chapter contains sections titled:

  • Dry Oxidation

  • Pore Corrosion

  • Creep Corrosion

  • Fretting Corrosion

  • Galvanic Corrosion

  • Stress Corrosion

  • Electrochemical Migration

  • Intermetallic Formation

  • Stress Relaxation

  • Creep

  • Fracture and Fatigue

  • Friction Polymerization

  • Whisker Growth

  • Fungus Growth

  • Contact Wear

  • Outgassing

  • Leakage Current and Dielectric Breakdown

  • Swelling

  • Summary

  • References