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Surface and Thin-Film Analysis, 5. Scanning Probe Microscopy

  1. Klaus Hunger,
  2. Peter Mischke,
  3. Wolfgang Rieper

Published Online: 15 OCT 2011

DOI: 10.1002/14356007.o25_o11

Ullmann's Encyclopedia of Industrial Chemistry

Ullmann's Encyclopedia of Industrial Chemistry

How to Cite

Hunger, K., Mischke, P. and Rieper, W. 2011. Surface and Thin-Film Analysis, 5. Scanning Probe Microscopy. Ullmann's Encyclopedia of Industrial Chemistry. .

Author Information

  1. Hoechst Aktiengesellschaft, Frankfurt/Main, Germany

Publication History

  1. Published Online: 15 OCT 2011

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Abstract

The article contains sections titled:

1.Introduction
2.Atomic Force Microscopy (AFM)
2.1.Principles
2.2.Instrumentation
2.3.Applications
3.Scanning Tunneling Microscopy (STM)
3.1.Principles
3.2.Instrumentation
3.3.Lateral and Spectroscopic Information
3.4.Applications