Original Paper
Interface Structure and Indirect Coupling in Annealed Fe/Cr/Fe Ultrathin Films
Article first published online: 28 FEB 2002
DOI: 10.1002/1521-396X(200202)189:3<705::AID-PSSA705>3.0.CO;2-J
© 2002 WILEY-VCH Verlag Berlin GmbH, Fed. Rep. of Germany
Additional Information
How to Cite
Kubik, M., Handke, B., KaraŚ, W., Spiridis, N., Ślęzak, T. and Korecki, J. (2002), Interface Structure and Indirect Coupling in Annealed Fe/Cr/Fe Ultrathin Films. physica status solidi (a), 189: 705–709. doi: 10.1002/1521-396X(200202)189:3<705::AID-PSSA705>3.0.CO;2-J
Publication History
- Issue published online: 28 FEB 2002
- Article first published online: 28 FEB 2002
- Manuscript Accepted: 30 SEP 2001
- Manuscript Received: 1 MAY 2001
- Abstract
- References
- Cited By
Keywords:
- 68.35.Ct;
- 68.60.Dv;
- 75.70.Ak;
- 75.70.Cn;
- 76.80.+y;
- S1.1;
- S1.2
Abstract
Molecular beam epitaxy grown (001) oriented Cr/Fe/Cr and Cr/Fe/Cr/Fe/Cr sandwiches were characterized using the conversion electron Mössbauer spectroscopy (CEMS), which proved that the FeCr interface extended up to about 2.5 atomic layers. Analysis of the CEMS results was based on a simple alloy-model of the Fe/Cr interface, resulting in concentration profiles of Fe and Cr atoms. The derived interface model was then used to study the effect of thermal annealing on the film properties. The CEMS studies were correlated with the measurements of the indirect exchange coupling followed by the magneto-optic Kerr effect. Whereas CEMS revealed a measurable effect of annealing on the interface atomic structure for the annealing temperature TA = 200 °C, the coupling character began to change at considerably higher temperature (about 400 °C).

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