Sensor Technology

Micromachine Scanning Tunneling Microscope Research in Japan

  1. Yasuo Wada1,
  2. Dai Kobayashi2,
  3. Hiroyuki Fujita3

Article first published online: 12 SEP 2001

DOI: 10.1002/1616-8984(199911)6:1<41::AID-SEUP41>3.0.CO;2-4

Issue

Sensors Update

Sensors Update

Volume 6, Issue 1, pages 41–58, November 1999

Additional Information

How to Cite

Wada, Y., Kobayashi, D. and Fujita, H. (1999), Micromachine Scanning Tunneling Microscope Research in Japan. Sensors Update, 6: 41–58. doi: 10.1002/1616-8984(199911)6:1<41::AID-SEUP41>3.0.CO;2-4

Author Information

  1. 1

    Advanced Res. Lab., Hitachi, Ltd., Hatoyama, Saitama 350-0321, Japan

  2. 2

    The 1st Dept. Optoelectronic Sys. Lab., Hitachi Cable Ltd., 5-1-1 Hitaka-cho, Hitachi-shi, Ibaraki, 319-1414, Japan

  3. 3

    The 3rd Dept., Institute of Ind. Science, The University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan

Publication History

  1. Issue published online: 12 SEP 2001
  2. Article first published online: 12 SEP 2001

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