Chapter 4. Scanning Transmission Electron Microscopy of Nanoparticles

  1. Professor Zhong Lin Wang
  1. Jingyue Liu

Published Online: 8 OCT 2001

DOI: 10.1002/3527600094.ch4

Characterization of Nanophase Materials

Characterization of Nanophase Materials

How to Cite

Liu, J. (1999) Scanning Transmission Electron Microscopy of Nanoparticles, in Characterization of Nanophase Materials (ed Z. L. Wang), Wiley-VCH Verlag GmbH, Weinheim, FRG. doi: 10.1002/3527600094.ch4

Editor Information

  1. Georgia Institute of Technology School of Materials Science and Engineering Atlanta, Georgia 30332-0245 USA

Author Information

  1. Monsanto Company Analytical Sciences Center 800 N. Lindbergh Blvd., U1E St. Louis, Missouri 63167 USA

Publication History

  1. Published Online: 8 OCT 2001
  2. Published Print: 11 NOV 1999

ISBN Information

Print ISBN: 9783527298372

Online ISBN: 9783527600090

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Keywords:

  • STEM;
  • imaging;
  • high-energy electrons;
  • coherent electron nanodiffraction;
  • secondary electrons;
  • auger electrons;
  • nanoanalysis

Summary

  • Introduction to STEM and associated techniques

  • STEM instrumentation

  • Imaging with high-energy electrons

  • Coherent electron nanodiffraction

  • Imaging with secondary electrons

  • Imaging with Auger electrons

  • Nanoanalysis with energy-loss electrons and X-rays

  • Summary