Investigation of Phase Transformations in Nanostructured Materials Produced by Severe Plastic Deformation

  1. Prof. Dr. Michael Zehetbauer2 and
  2. Prof. Ruslan Z. Valiev3
  1. X. Sauvage,
  2. A. Guillet and
  3. D. Blavette

Published Online: 28 JAN 2005

DOI: 10.1002/3527602461.ch3b

Nanomaterials by Severe Plastic Deformation

Nanomaterials by Severe Plastic Deformation

How to Cite

Sauvage, X., Guillet, A. and Blavette, D. (2004) Investigation of Phase Transformations in Nanostructured Materials Produced by Severe Plastic Deformation, in Nanomaterials by Severe Plastic Deformation (eds M. Zehetbauer and R. Z. Valiev), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527602461.ch3b

Editor Information

  1. 2

    Institut für Materialphysik, Universität Wien, Boltzmanngasse 5, 1090 Wien, Austria

  2. 3

    Institute of Physics of Advanced Materials, Ufa State Aviation Technical University, 12 K. Marks Str., Ufa, 450 000, Russia

Author Information

  1. Groupe de Physique des matériaux, UMR CNRS 6634, Université de Rouen, site du Madrillet, Avenue de l'Université, Saint Etienne du Rouvray – Cedex, France

Publication History

  1. Published Online: 28 JAN 2005
  2. Published Print: 25 FEB 2004

ISBN Information

Print ISBN: 9783527306596

Online ISBN: 9783527602469

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Keywords:

  • severe plastic deformation (SPD);
  • phase transformations in nanostructured materials;
  • severe plastic deformation;
  • investigation;
  • transmission electron microscopy (TEM);
  • high resolution TEM (HRTEM);
  • field ion microscopy (FIM);
  • 3D atom probe

Summary

The aim of this study is to get further understanding on the mechanisms of such phase transformations. Nanoscaled structures of materials prepared by drawing were investigated because they exhibit quite a simple grain morphology: most of interfaces are aligned along the wire axis [6]. The microstructures were investigated thanks to transmission electron microscopy (TEM), high resolution TEM (HRTEM), Field Ion Microscopy (FIM) and 3D Atom Probe [15].