The Meaning of Size Obtained from Broadened X-Ray Diffraction Peaks

  1. Prof. Dr. Michael Zehetbauer2 and
  2. Prof. Ruslan Z. Valiev3
  1. Tamás Ungár

Published Online: 28 JAN 2005

DOI: 10.1002/3527602461.ch7a

Nanomaterials by Severe Plastic Deformation

Nanomaterials by Severe Plastic Deformation

How to Cite

Ungár, T. (2004) The Meaning of Size Obtained from Broadened X-Ray Diffraction Peaks, in Nanomaterials by Severe Plastic Deformation (eds M. Zehetbauer and R. Z. Valiev), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527602461.ch7a

Editor Information

  1. 2

    Institut für Materialphysik, Universität Wien, Boltzmanngasse 5, 1090 Wien, Austria

  2. 3

    Institute of Physics of Advanced Materials, Ufa State Aviation Technical University, 12 K. Marks Str., Ufa, 450 000, Russia

Author Information

  1. Department of General Physics, Eötvös University, Budapest, Hungary

Publication History

  1. Published Online: 28 JAN 2005
  2. Published Print: 25 FEB 2004

ISBN Information

Print ISBN: 9783527306596

Online ISBN: 9783527602469

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Keywords:

  • X-ray diffraction peak profile analysis (DPPA);
  • characterisation of microstructures

Summary

X-ray diffraction peak profile analysis (DPPA) is a powerful tool for the characterisation of microstructures either in the bulk or in loose powder materials. The evaluation and modelling procedures have been developed together with the experimental techniques. The dislocation density and structure, as obtained from peak profile analysis, is in good correlation with TEM observations. As for the crystallite size, in some cases a good correlation, however, in other cases definite discrepancies with TEM results can be observed. In the present work those literature data are critically reviewed where crystallite size or grain size have been determined by DPPA and TEM simultaneously. The correlation and discrepancies between DPPA and TEM results are discussed in terms of the microstructures in different types of specimens.