X-Ray Peak Profile Analysis on the Microstructure of Al-5.9%Mg-0.3%Sc-0.18%Zr Alloy Deformed by High Pressure Torsion Straining

  1. Prof. Dr. Michael Zehetbauer4 and
  2. Prof. Ruslan Z. Valiev5
  1. Jen Gubicza1,2,
  2. Dániel Fátay1,
  3. Krisztián Nyilas1,
  4. Elena Bastarash3,
  5. Sergey Dobatkin3 and
  6. Tamás Ungár1

Published Online: 28 JAN 2005

DOI: 10.1002/3527602461.ch7d

Nanomaterials by Severe Plastic Deformation

Nanomaterials by Severe Plastic Deformation

How to Cite

Gubicza, J., Fátay, D., Nyilas, K. , Bastarash, E., Dobatkin, S. and Ungár, T. (2004) X-Ray Peak Profile Analysis on the Microstructure of Al-5.9%Mg-0.3%Sc-0.18%Zr Alloy Deformed by High Pressure Torsion Straining, in Nanomaterials by Severe Plastic Deformation (eds M. Zehetbauer and R. Z. Valiev), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527602461.ch7d

Editor Information

  1. 4

    Institut für Materialphysik, Universität Wien, Boltzmanngasse 5, 1090 Wien, Austria

  2. 5

    Institute of Physics of Advanced Materials, Ufa State Aviation Technical University, 12 K. Marks Str., Ufa, 450 000, Russia

Author Information

  1. 1

    Department of General Physics, Eötvös University, Budapest, Hungary

  2. 2

    Department of Solid State Physics, Eötvös University, Budapest, Hungary

  3. 3

    Moscow State Steel and Alloys Institute (Technological University), Moscow, Russia

Publication History

  1. Published Online: 28 JAN 2005
  2. Published Print: 25 FEB 2004

ISBN Information

Print ISBN: 9783527306596

Online ISBN: 9783527602469

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Keywords:

  • X-ray peak profile analysis;
  • microstructure of Al-5.9%Mg-0.3%Sc-0.18%Zr alloy;
  • high pressure torsion straining (HPT);
  • severe plastic deformation;
  • X-ray diffraction peak profile analysis;
  • transmission electron microscopy (TEM)

Summary

The microstructure of plastically deformed Al-5.9at%Mg-0.3%Sc-0.18%Zr alloy has been investigated. The severe plastic deformation has been performed by high pressure torsion straining (HPT) up to 15 revolutions at room temperature. The microstructure as a function of the number of revolutions is studied by X-ray diffraction peak profile analysis. It is concluded that the HPT technique results in nanostructure even after 0.5 turn with very high dislocation density. The crystallite size decreases and the dislocation density increases with the number of revolutions, however, after five turns they go into saturation. The edge and the dipole character of the dislocation structure becomes stronger with the increase of the number of revolutions. The value of the crystallite size determined by X-ray peak profile analysis is a bit smaller than the grain size obtained by transmission electron microscopy (TEM).