Chapter 9. Nanometer-Scale View of the Electrified Interface: Scanning Probe Microscopy Study

  1. Prof. Dr. Hans-Jörg Fecht2,3 and
  2. Dr. Matthias Werner4
  1. Peter Müller,
  2. Laura Rossi and
  3. Santos F. Alvarado

Published Online: 13 JUL 2005

DOI: 10.1002/3527604111.ch9

The Nano-Micro Interface: Bridging the Micro and Nano Worlds

The Nano-Micro Interface: Bridging the Micro and Nano Worlds

How to Cite

Müller, P., Rossi, L. and Alvarado, S. F. (2004) Nanometer-Scale View of the Electrified Interface: Scanning Probe Microscopy Study, in The Nano-Micro Interface: Bridging the Micro and Nano Worlds (eds H.-J. Fecht and M. Werner), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527604111.ch9

Editor Information

  1. 2

    University of Ulm, Faculty of Engineering, Materials Division, Albert-Einstein-Allee 47, 89081 Ulm, Germany

  2. 3

    Forschungszentrum Karlsruhe, Institute of Nanotechnology (INT), P.O. Box 3640, 76021 Karlsruhe, Germany

  3. 4

    NMTC, Soorstrasse 86, 14050 Berlin, Germany

Author Information

  1. IBM Zurich Research Laboratory, Säumerstraße 4, CH-8803 Rüschlikon, Switzerland

Publication History

  1. Published Online: 13 JUL 2005
  2. Published Print: 23 SEP 2004

ISBN Information

Print ISBN: 9783527309788

Online ISBN: 9783527604111

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Keywords:

  • nano–micro interface;
  • STM z-V spectroscopy;
  • Alq3 thin films on Au(111);
  • CuPc thin films on Au(111)

Summary

This chapter contains sections titled:

  • Introduction

  • STM z–V Spectroscopy

  • Experimental Details

    • Alq3 Thin Films on Au(111)

    • CuPc Thin Films on Au(111)

  • Concluding Remarks