Local Texture Characterisation Using TEM

  1. Prof. T. W. Clyne and
  2. F. Simancik
  1. E. Bouzy and
  2. J.J. Fundenberger

Published Online: 21 DEC 2005

DOI: 10.1002/3527606203.ch20

Metal Matrix Composites and Metallic Foams, Volume 5

Metal Matrix Composites and Metallic Foams, Volume 5

How to Cite

Bouzy, E. and Fundenberger, J.J. (2000) Local Texture Characterisation Using TEM, in Metal Matrix Composites and Metallic Foams, Volume 5 (eds T. W. Clyne and F. Simancik), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527606203.ch20

Editor Information

  1. Department of Materials Science and Metallurgy, Cambridge University, Pembroke Street, Cambridge CB2 3QZ, U.K.

Author Information

  1. LETAM, CNRS URA 2090, University of Metz, F-57045 Metz, France

Publication History

  1. Published Online: 21 DEC 2005
  2. Published Print: 20 APR 2000

Book Series:

  1. EUROMAT 99

ISBN Information

Print ISBN: 9783527301263

Online ISBN: 9783527606207

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Keywords:

  • local texture characterisation;
  • TEM

Summary

On-line measurements of single grain orientations by indexing transmission Kikuchi diffraction patterns in the TEM is a very useful technique for fine scale investigations like grain or twin boundary, deformation mechanism or phase transformation. Therefore our attention goes to the development of an interactive indexing computer program the use of which is justified in the case of TEM. The procedure for indexing Kikuchi diagrams is divided into two steps: (i) a first solution is found using at least 3 not concurrent Kikuchi bands chosen by the operator; (ii) if the operator agrees with the proposed solution, other bands can be added and the computer program gives the solution which minimises the angular distance between measured and computed patterns in terms of least-squares. Our aim here is to discuss the relative precision of the crystal orientation versus some experimental settings. The influence of the band's count, the operator's dexterity and some instrumental settings like diffraction focus and calibration will be discussed. An application to twin-matrix interface characterisation in the case of a well-known fcc Σ3 twin boundary is done in order to illustrate the influence of the various parameters.