Advances in High Resolution Elemental Analysis Using Image-Spectroscopy
- Prof. T. W. Clyne and
- F. Simancik
Published Online: 21 DEC 2005
Copyright © 2000 Wiley-VCH Verlag GmbH, Weinheim
Metal Matrix Composites and Metallic Foams, Volume 5
How to Cite
Weyland, M., Thomas, P. J. and Midgley, P. A. (2000) Advances in High Resolution Elemental Analysis Using Image-Spectroscopy, in Metal Matrix Composites and Metallic Foams, Volume 5 (eds T. W. Clyne and F. Simancik), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527606203.ch29
Department of Materials Science and Metallurgy, Cambridge University, Pembroke Street, Cambridge CB2 3QZ, U.K.
- Published Online: 21 DEC 2005
- Published Print: 20 APR 2000
Print ISBN: 9783527301263
Online ISBN: 9783527606207
- high resolution elemental analysis;
- image spectroscopy
Conventionally EFTEM elemental maps are calculated from two or three images acquired before and after an ionisation edge, methods known as ‘jump-ratio’ or ‘three-window’ mapping respectively. As computers that can manipulate large data sets have become widespread it has become feasible to acquire a series of images over a large energy loss range hence over many spectral features. This technique is known as ‘image-spectroscopy’ and is analogous with spectrum-imaging in the STEM. The increase in spectral information offers distinct advantages over traditional methods. In this work a case study will be presented on an extensively sensitised 316 stainless steel to demonstrate the advantages of such an approach for materials science applications.