HREM of High-Tc Bi-2212 Superconducting Films on Vicinal Substrates

  1. Prof. Dr. M. Rühle3 and
  2. Prof. Dr. H. Gleiter4
  1. E. Connolly1,
  2. V.L. Svetchnikov1,
  3. H.W. Zandbergen1,
  4. J. Pedarnig2,
  5. R. Rössler2 and
  6. D. Bäuerle2

Published Online: 23 DEC 2005

DOI: 10.1002/352760622X.ch10

Interface Controlled Materials, Volume 9

Interface Controlled Materials, Volume 9

How to Cite

Connolly, E., Svetchnikov, V.L., Zandbergen, H.W., Pedarnig, J., Rössler, R. and Bäuerle, D. (2000) HREM of High-Tc Bi-2212 Superconducting Films on Vicinal Substrates, in Interface Controlled Materials, Volume 9 (eds M. Rühle and H. Gleiter), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/352760622X.ch10

Editor Information

  1. 3

    Max-Planck-Institut für Metallforschung, Seestraße 92, 70174 Stuttgart, Germany

  2. 4

    Forschungszentrum Karlsruhe, Postfach 3640, 76021 Karlsruhe, Germany

Author Information

  1. 1

    National Centre for HREM, Laboratory of Materials Science, Technische Universiteit Delft, Delft, Netherlands

  2. 2

    Abteilung für Angewandte Physik, Institut für Experimentalphysik, Johannes-Kepler-Universität, Linz, Austria

Publication History

  1. Published Online: 23 DEC 2005
  2. Published Print: 27 JUN 2000

Book Series:

  1. EUROMAT 99

ISBN Information

Print ISBN: 9783527301911

Online ISBN: 9783527606221

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Keywords:

  • interface controlled materials;
  • high resolution electron microscopy;
  • Bi2Sr2CaCu2O8 (Bi-2212) superconducting films;
  • vicinal substrates

Summary

High resolution electron microscopy has been used to investigate the defect structure – both at the film/substrate interface and within the film – induced in Bi2Sr2CaCu2O8 (Bi-2212) films deposited on vicinal (001) SrTiO3 substrates. The deposited films were approximately 20–100 nm thick. For vicinal angles less than ∼15, the Bi-2212 films were observed to grow exclusively c-axis oriented, with various defects such as antiphase boundaries, stacking faults, and steps at the film surface. For the 20° vicinal sample, small areas of the film were observed to have their c-axis perpendicular to the vicinal surface. Crystal misorientations and microstructure for different vicinal angles are discussed.