Interface Interaction in Metal-C60 Nanostructured Thin Films

  1. Prof. Dr. M. Rühle3 and
  2. Prof. Dr. H. Gleiter4
  1. A. Devenyi1,
  2. A. Belu-Marian1,
  3. R. Popescu1,
  4. D. Macovei1,
  5. P.B. Barna2,
  6. J.L. Labar2 and
  7. R. Manaila1

Published Online: 23 DEC 2005

DOI: 10.1002/352760622X.ch46

Interface Controlled Materials, Volume 9

Interface Controlled Materials, Volume 9

How to Cite

Devenyi, A., Belu-Marian, A., Popescu, R., Macovei, D., Barna, P.B., Labar, J.L. and Manaila, R. (2000) Interface Interaction in Metal-C60 Nanostructured Thin Films, in Interface Controlled Materials, Volume 9 (eds M. Rühle and H. Gleiter), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/352760622X.ch46

Editor Information

  1. 3

    Max-Planck-Institut für Metallforschung, Seestraße 92, 70174 Stuttgart, Germany

  2. 4

    Forschungszentrum Karlsruhe, Postfach 3640, 76021 Karlsruhe, Germany

Author Information

  1. 1

    National Institute for Physics of Materials, P.O. Box MG7, RO-76900 Bucharest-Magurele, Romania

  2. 2

    Research Institute for Technical Physics and Materials Science, Budapest, Hungary

Publication History

  1. Published Online: 23 DEC 2005
  2. Published Print: 27 JUN 2000

Book Series:

  1. EUROMAT 99

ISBN Information

Print ISBN: 9783527301911

Online ISBN: 9783527606221

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Keywords:

  • interface controlled materials;
  • metal-C60 nanostructured thin films;
  • interface interaction;
  • X-ray diffraction;
  • EXAFS;
  • Raman spectroscopy

Summary

The present paper reports on structural evidence for interface interaction in nano-systems Cu-C60and Au-C60, prepared as co-evaporated thin films. X-ray diffraction, EXAFS and Raman evidence will be brought forward.