Chapter 2. Modeling Fundamental Aspects of the Surface Chemistry of Oxides and their Interactions with Coupling Agents

  1. Prof. Dr. Wulff Possart
  1. P. Schiffels1,
  2. M. Amkreutz2,
  3. A. T. Blumenau3,
  4. T. Krüger2,
  5. B. Schneider1,
  6. T. Frauenheim2 and
  7. O.-D. Hennemann1

Published Online: 28 APR 2006

DOI: 10.1002/3527607307.ch2

Adhesion: Current Research and Applications

Adhesion: Current Research and Applications

How to Cite

Schiffels, P., Amkreutz, M., Blumenau, A. T., Krüger, T., Schneider, B., Frauenheim, T. and Hennemann, O.-D. (2005) Modeling Fundamental Aspects of the Surface Chemistry of Oxides and their Interactions with Coupling Agents, in Adhesion: Current Research and Applications (ed W. Possart), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527607307.ch2

Editor Information

  1. Laboratoire Européen de Recherche Universitaire Saarland-Lorraine (LERUSL), Universität des Saarlandes, Gebäude 22-6, Postfach 151150, 66041 Saarbrücken, Germany

Author Information

  1. 1

    Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialfoschung (IFAM), Wiener Str. 12, 28359 Bremen, Germany

  2. 2

    Universität Paderborn, Fachbereich Physik, Theoretische Physik, Warburger Str. 100, 33100 Paderborn, Germany

  3. 3

    Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, 40237 Düsseldorf, Germany

Publication History

  1. Published Online: 28 APR 2006
  2. Published Print: 24 AUG 2005

ISBN Information

Print ISBN: 9783527312634

Online ISBN: 9783527607303

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Keywords:

  • adhesion;
  • research;
  • application;
  • surface chemistry of oxides;
  • interactions with coupling agents;
  • atomistic simulations in adhesion;
  • ideal reconstructions on α-SiO2

Summary

This chapter contains sections titled:

  • Abstract

  • Introduction: Atomistic Simulations in Adhesion

  • Prediction of Surface Properties: Ideal Reconstructions on α-SiO2 (0001)

  • Organic Components of the Adhesive and Substrate-Adhesive Interaction

  • Conclusion and Outlook

  • References