Chapter 3. Adhesion at the Nanoscale: an Approach by AFM

  1. Prof. Dr. Wulff Possart
  1. M. Brogly,
  2. O. Noel,
  3. G. Castelein and
  4. J. Schultz

Published Online: 28 APR 2006

DOI: 10.1002/3527607307.ch3

Adhesion: Current Research and Applications

Adhesion: Current Research and Applications

How to Cite

Brogly, M., Noel, O., Castelein, G. and Schultz, J. (2005) Adhesion at the Nanoscale: an Approach by AFM, in Adhesion: Current Research and Applications (ed W. Possart), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527607307.ch3

Editor Information

  1. Laboratoire Européen de Recherche Universitaire Saarland-Lorraine (LERUSL), Universität des Saarlandes, Gebäude 22-6, Postfach 151150, 66041 Saarbrücken, Germany

Author Information

  1. Université de Haute Alsace (UHA), Institut de Chimie des Surfaces et Interfaces (ICSI), CNRS UPR 9069, 15, rue Jean Starcky, 68057 Mulhouse Cedex, France

Publication History

  1. Published Online: 28 APR 2006
  2. Published Print: 24 AUG 2005

ISBN Information

Print ISBN: 9783527312634

Online ISBN: 9783527607303

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Keywords:

  • adhesion;
  • research;
  • application;
  • nanoscale;
  • atomic force microscopy (AFM) calibration;
  • materials;
  • methods

Summary

This chapter contains sections titled:

  • Abstract

  • Introduction

  • Materials and Methods

    • Preparation of Oxidized Silica Surface

    • Grafting of Functionalized SAMs onto Silicon Wafer

    • Crosslinking and Functionalization of PDMS Networks

    • Characterization of the SAMs

  • Results and Discussion

    • Force-Distance Curve Measurements and AFM Calibration

      • Force-Distance Curve Features

      • The DD Curve (Contact Mode)

      • AFM Calibration

        • Determination of the Spring Constant of the Cantilever

        • Nonlinearity of the Quadrant of Photodiodes

        • Scan Rate of the Cantilever

        • Systematic Check

    • Force-Distance Curves on Rigid Systems of Controlled Surface Chemistry

    • Force-Distance Measurements on Polymers

      • Force-Indentation Measurements on Polymers

      • Force-Indentation Curves on Systems of Controlled Surface Chemistry and Controlled Mechanical Properties

  • Conclusion

  • References