Chapter 10. Chemical Force Microscopy: Nanometer-Scale Surface Analysis with Chemical Sensitivity

  1. Dr. Paolo Samorì2,3
  1. Holger Schönherr and
  2. G. Julius Vancso

Published Online: 29 JUN 2006

DOI: 10.1002/3527608516.ch10

Scanning Probe Microscopies Beyond Imaging: Manipulation of Molecules and Nanostructures

Scanning Probe Microscopies Beyond Imaging: Manipulation of Molecules and Nanostructures

How to Cite

Schönherr, H. and Vancso, G. J. (2006) Chemical Force Microscopy: Nanometer-Scale Surface Analysis with Chemical Sensitivity, in Scanning Probe Microscopies Beyond Imaging: Manipulation of Molecules and Nanostructures (ed P. Samorì), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527608516.ch10

Editor Information

  1. 2

    Istituto per la Sintesi Organica e la Fotoreattività, Consiglio Nazionale delle Ricerche, via Gobetti 101, 40129 Bologna, Italy

  2. 3

    Institut de Science et d'Ingénierie, Supramoléculaires (ISIS), Université Louis Pasteur, 8 allée Gaspard Monge, 67083 Strasbourg, France

Author Information

  1. University of Twente, MESA+ Institute for Nanotechnology and Faculty of Science and Technology, Department of Materials Science and Technology of Polymers, 7500 AE Enschede, The Netherlands

Publication History

  1. Published Online: 29 JUN 2006
  2. Published Print: 6 JUN 2006

ISBN Information

Print ISBN: 9783527312696

Online ISBN: 9783527608515

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Keywords:

  • chemical force microscopy (CFM);
  • basics;
  • force measurements and mapping in CFM;
  • normal forces;
  • lateral forces;
  • AFM using chemically modified tips;
  • applications of CFM;
  • surface characterization by CFM;
  • compositional mapping of heterogeneous surfaces

Summary

This chapter contains sections titled:

  • Introduction: Mapping of Surface Composition by AFM Approaches

  • Chemical Force Microscopy: Basics

    • Surface Modification Procedures for Tip Modification

      • Thiol-Based Self-Assembled Monolayers (SAMs) on Gold

      • SAMs on Hydroxylated Silicon and Si3N4

      • Modified Carbon Nanotube Probes

    • Force Measurements and Mapping in CFM

      • Normal Forces

      • Lateral Forces

      • Intermittent Contact Mode Phase Imaging

    • AFM Using Chemically Modified Tips

      • Stability of SAMs and Modified Tips

      • Imaging with Optimized Forces

      • Distinguishing Different Functional Groups on Surfaces by CFM

      • Artifacts and Experimental Difficulties

  • Applications of CFM

    • Surface Characterization by CFM

      • Tip–Sample Forces and Interfacial Free Energies

      • Acid–Base Titrations

      • Following Surface Chemical Reactions in SAMs

    • Compositional Mapping of Heterogeneous Surfaces

      • Micro- and Nanometer-Scale Patterned SAMs

      • Heterogeneous and Multiphase Systems

      • Surface-Treated Polymers

  • Outlook