Chapter 5. Electrical and Environmental Stability of Polymer Thin-Film Transistors

  1. Dr. Hagen Klauk
  1. Alberto Salleo1 and
  2. Michael L. Chabinyc2

Published Online: 28 AUG 2006

DOI: 10.1002/3527608753.ch5

Organic Electronics: Materials, Manufacturing and Applications

Organic Electronics: Materials, Manufacturing and Applications

How to Cite

Salleo, A. and Chabinyc, M. L. (2006) Electrical and Environmental Stability of Polymer Thin-Film Transistors, in Organic Electronics: Materials, Manufacturing and Applications (ed H. Klauk), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, FRG. doi: 10.1002/3527608753.ch5

Editor Information

  1. Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany

Author Information

  1. 1

    Department of Materials Science and Engineering, Stanford University, Stanford, Ca 94305-2205, USA

  2. 2

    Electronic Materials and Devices Laboratory, Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, CA 94304, USA

Publication History

  1. Published Online: 28 AUG 2006
  2. Published Print: 22 MAY 2006

ISBN Information

Print ISBN: 9783527312641

Online ISBN: 9783527608751

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Keywords:

  • organic electronics;
  • advanced materials;
  • electrical stability of polymer thin-film transistors (TFTs);
  • environmental stability of polymer thin-film transistors (TFTs);
  • charge trapping in TFTs;
  • bias stress in polyfluorene TETs;
  • bias stress in polythiophene TFTs;
  • chemical effects on stability;
  • defects;
  • impurities

Summary

This chapter contains sections titled:

  • Introduction

  • Charge Trapping in TFTs

    • General Considerations

    • Bias Stress in Organic Transistors

  • Bias Stress in Polyfluorene and Polythiophene TFTs

    • Reversible Bias Stress

    • Long-lived Bias Stress

    • Dependence of Bias Stress on Operating Conditions; Lifetime Predictions

    • A Microscopic Theory of Bias Stress

  • Chemical Effects on Stability – Defects and Impurities

    • Introduction

    • Defects in Molecular Structure

      • Defects from Synthesis

      • Photo-induced Defects

      • Thermochemical Analysis

      • Oxygen

      • Water

      • Organic Solvents

      • Inorganic Impurities

    • Impurities

    • Studies of TFT Lifetime

  • Conclusion

  • Acknowledgments

  • References