X-Ray Photoelectron and Auger Electron Spectroscopy
X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Published Online: 15 SEP 2006
Copyright © 2000 John Wiley & Sons, Ltd. All rights reserved.
Encyclopedia of Analytical Chemistry
How to Cite
Turner, N. H. 2006. X-Ray Photoelectron and Auger Electron Spectroscopy. Encyclopedia of Analytical Chemistry. .
- Published Online: 15 SEP 2006
The use of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) to analyze the surface composition and chemical environment of solids has been well established since about the early 1970s. These approaches find many applications in both basic and applied scientific investigations. The basic principles, i.e. surface sensitivity, the experimental observations employing these procedures, and the working methods, are described. The instrumentation utilized with the commonly available equipment for these approaches is summarized also.