Chapter 11. Defect Analysis
Published Online: 11 JAN 2007
DOI: 10.1002/9780470059395.ch11
Copyright © 2007 John Wiley & Sons, Ltd
Book Title
S60 Smartphone Quality Assurance: A Guide for Mobile Engineers and Developers
Additional Information
How to Cite
Laitinen, S. (2007) Defect Analysis, in S60 Smartphone Quality Assurance: A Guide for Mobile Engineers and Developers, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470059395.ch11
Publication History
- Published Online: 11 JAN 2007
- Published Print: 12 JAN 2007
ISBN Information
Print ISBN: 9780470056851
Online ISBN: 9780470059395
- Summary
- Chapter
Keywords:
- defect analysis;
- testing and sensible error fixing;
- ‘three-D-rule’;
- defect management process;
- defect priority;
- Priority Critical and customer satisfaction;
- defect reporting tool;
- fixing period and professional defect handling
Summary
This chapter contains sections titled:
Focused Testing
Defect Analysis and Reporting
Summary