Chapter 11. Defect Analysis

  1. Saila Laitinen M.Sc. project manager engineer

Published Online: 11 JAN 2007

DOI: 10.1002/9780470059395.ch11

S60 Smartphone Quality Assurance: A Guide for Mobile Engineers and Developers

S60 Smartphone Quality Assurance: A Guide for Mobile Engineers and Developers

How to Cite

Laitinen, S. (2007) Defect Analysis, in S60 Smartphone Quality Assurance: A Guide for Mobile Engineers and Developers, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470059395.ch11

Author Information

  1. Nokia, Finland

Publication History

  1. Published Online: 11 JAN 2007
  2. Published Print: 12 JAN 2007

ISBN Information

Print ISBN: 9780470056851

Online ISBN: 9780470059395

SEARCH

Keywords:

  • defect analysis;
  • testing and sensible error fixing;
  • ‘three-D-rule’;
  • defect management process;
  • defect priority;
  • Priority Critical and customer satisfaction;
  • defect reporting tool;
  • fixing period and professional defect handling

Summary

This chapter contains sections titled:

  • Focused Testing

  • Defect Analysis and Reporting

  • Summary