Prognostics and Health Management of Electronics
Published Online: 15 SEP 2009
Copyright © 2009 John Wiley & Sons, Ltd. All rights reserved.
Encyclopedia of Structural Health Monitoring
How to Cite
Pecht, M. 2009. Prognostics and Health Management of Electronics. Encyclopedia of Structural Health Monitoring. .
- Published Online: 15 SEP 2009
Reliability is the ability of a product or system to perform as intended (i.e., without failure and within specified performance limits) for a specified time, in its life-cycle environment. Commonly used electronics reliability prediction methods (e.g., Mil-HDBK-217, 217-PLUS, PRISM, Telcordia, FIDES) based on handbook methods have been shown to be misleading and provide erroneous life predictions. The use of stress and damage models permits a far superior accounting of the reliability and the physics of failure (PoF); however, sufficient knowledge of the actual operating and environmental application conditions of the product is still required.
This article presents a PoF-based prognostics and health management approach for effective reliability prediction. PoF is an approach that utilizes knowledge of a product's life-cycle loading and failure mechanisms to perform reliability modeling, design, and assessment. This method permits the assessment of the reliability of a system under its actual application conditions. It integrates sensor data with models that enable in situ assessment of the deviation or degradation of a product from an expected normal operating condition and the prediction of the future state of reliability. This article presents a formal implementation procedure, which includes failure modes, mechanisms, and effects analysis, data reduction and feature extraction from the life-cycle loads, damage accumulation, and assessment of uncertainty. Applications of PoF-based prognostics and health management are also discussed.
- physics of failure;
- reliability prediction