73. Defect Detection Using the MTS

  1. Dr. Genichi Taguchi engineering Executive Director Honorary Member,
  2. Dr. Subir Chowdhury aerospace engineering, industrial management chairman CEO world leader strategist author honorary member honorary doctorate and
  3. Yuin Wu B.S. in chemical engineering professor Executive Director consultant

Published Online: 26 NOV 2007

DOI: 10.1002/9780470258354.cs73

Taguchi's Quality Engineering Handbook

Taguchi's Quality Engineering Handbook

How to Cite

Taguchi, G., Chowdhury, S. and Wu, Y. (2004) Defect Detection Using the MTS, in Taguchi's Quality Engineering Handbook, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470258354.cs73

Author Information

  1. American Supplier Institute (ASI), USA

Publication History

  1. Published Online: 26 NOV 2007
  2. Published Print: 22 OCT 2004

ISBN Information

Print ISBN: 9780471413349

Online ISBN: 9780470258354

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Keywords:

  • visual inspection or automated inspection process;
  • change-coupled device camera;
  • clutch disk appearance inspection;
  • larger-the-better SN ratio

Summary

This chapter contains sections titled:

  • Introduction

  • Differential and Integral Characteristics

  • Preparation of Base Space

  • Item Selection Using Orthogonal Array L64

  • Reference