11. Dielectric and Microstructural Properties of Ba(Ti1−xZrx)O3 Thin Films on Copper Substrates
- Sheng Yao,
- Bruce Tuttle,
- Clive Randall and
- Dwight Viehland
Published Online: 26 MAR 2008
Copyright © 2005 The American Ceramic Society
Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5
How to Cite
Ihlefeld, J. F., Maria, J.-P. and Borland, W. (2005) Dielectric and Microstructural Properties of Ba(Ti1−xZrx)O3 Thin Films on Copper Substrates, in Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5 (eds S. Yao, B. Tuttle, C. Randall and D. Viehland), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470291252.ch11
- Published Online: 26 MAR 2008
- Published Print: 1 JAN 2005
Print ISBN: 9781574982350
Online ISBN: 9780470291252
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