19. Growth of LaAlO3 Single Crystal by Floating Zone Method and its Microwave Properties

  1. Sheng Yao,
  2. Bruce Tuttle,
  3. Clive Randall and
  4. Dwight Viehland
  1. Shotaro Suzuki1,
  2. Hitoshi Ohsato1,
  3. Ken-Ichi Kakimoto1,
  4. Takeshi Shimada2,
  5. Katsuhiro Sasaki3 and
  6. Hiroyasu Saka3

Published Online: 26 MAR 2008

DOI: 10.1002/9780470291252.ch19

Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5

Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5

How to Cite

Suzuki, S., Ohsato, H., Kakimoto, K.-I., Shimada, T., Sasaki, K. and Saka, H. (2005) Growth of LaAlO3 Single Crystal by Floating Zone Method and its Microwave Properties, in Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5 (eds S. Yao, B. Tuttle, C. Randall and D. Viehland), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470291252.ch19

Author Information

  1. 1

    Nagoya Institute of Technology, Gokiso-cho, Showa-ku Nagoya, Japan, 466-8555

  2. 2

    NEOMAX Co., Ltd. 2-15-17 Egawa, Shimamoto-cho Mishima-gun Osaka, Japan, 618-0013

  3. 3

    Nagoya University Furo-cho, Chikusa-ku Nagoya, Japan, 464-0814

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 2005

ISBN Information

Print ISBN: 9781574982350

Online ISBN: 9780470291252

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Keywords:

  • homogeneity;
  • crystallographic;
  • crystals;
  • polysynthetic;
  • superconducting

Summary

Lanthanum aluminate (LaAlO3) single crystals were grown by float zone (FZ) method. (100) LaAlO3 single crystal wafer was used as a seed. Crystal growth of LaAlO3 without crack was achieved by the use of sintered rod with high density and homogeneity. Depending on the growth rate, the crystals showed a different color. Crystals grown in the rage of 5 to 20 mm/h exhibited a reddish-brown color, whereas crystals grown at 2 mm/h were colorless. These crystals were epitaxially grown to the seed crystal. The crystallographic information determined by IP-XRD (imaging plate X-ray diffractmeter) well agreed with the literature based on the pseudo-cubic structure. In the microstructure the grown crystals had polysynthetic twins of (100) phase on the plane perpendicular to the growth direction. The dielectric constant of each sample maintained in the vicinity of 24, while the quality factor (Qf) value depended on the growth rate. Very high Qf value of 390,000 GHz was obtained in the case of growth rate of 20 mm/h.