23. Measurement of Complex Permittivity of Low Temperature Co-Fired Ceramic at Cryogenic Temperatures

  1. Sheng Yao,
  2. Bruce Tuttle,
  3. Clive Randall and
  4. Dwight Viehland
  1. Mohan V. Jacob1,
  2. Janina Mazierska2,3 and
  3. Marek Bialkowski4

Published Online: 26 MAR 2008

DOI: 10.1002/9780470291252.ch23

Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5

Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5

How to Cite

Jacob, M. V., Mazierska, J. and Bialkowski, M. (2005) Measurement of Complex Permittivity of Low Temperature Co-Fired Ceramic at Cryogenic Temperatures, in Advances in Electronic Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 26, Number 5 (eds S. Yao, B. Tuttle, C. Randall and D. Viehland), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470291252.ch23

Author Information

  1. 1

    Electrical And Computer Engineering, James Cook University, Townsville, Australia

  2. 2

    Institute of Information Sciences, Massey University, Palmerston North, New Zealand

  3. 3

    Electrical And Computer Engineering, James Cook University, Townsville, Australia

  4. 4

    School of Information Technology and Electrical Engineering, University of Queensland, Australia

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 2005

ISBN Information

Print ISBN: 9781574982350

Online ISBN: 9780470291252

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Keywords:

  • communication;
  • permittivity;
  • utilisation;
  • electromagnetic;
  • parameters

Summary

Precise knowledge of microwave properties of Low Temperature Co-fired Ceramic LTCC materials is crucial for efficient design of microwave systems, especially for design of communication filters. Many communication devices operate at low temperatures. In order to implement LTCC at low temperature communication circuits and devices, Engineers need precise values of the complex permittivity. The aim of this paper is to characterise LTCC material as a function of temperature at microwave frequencies using a very precise measurement technique, Split Post Dielectric Resonator. The Transmission Mode Q-factor technique that eliminates all the parasitic losses during the characterisation was used for the S-parameter data processing. The permittivity and loss tangent data of LTCC manufactured by Heraeus Circuit Materials Division in the temperature range 20 K - 300K at a frequency of 9.5 GHz is reported in this paper. The random uncertainty in ϵτ and tanδ are better than 0.3% and 5 % respectively.