Chapter 30. Rapid, In-Situ, Ultra-High Temperature Investigations of Ceramics using Synchrotron X-Ray Diffraction

  1. Rajan Tandon,
  2. Andrew Wereszczak and
  3. Edgar Lara-Curzio
  1. P. Sarin1,
  2. R. P. Haggerty1,
  3. W. Yoon1,
  4. W. M. Kriven1,
  5. M. Knap2 and
  6. P. Zschack3

Published Online: 27 MAR 2008

DOI: 10.1002/9780470291313.ch30

Mechanical Properties and Performance of Engineering Ceramics II: Ceramic Engineering and Science Proceedings, Volume 27, Issue 2

Mechanical Properties and Performance of Engineering Ceramics II: Ceramic Engineering and Science Proceedings, Volume 27, Issue 2

How to Cite

Sarin, P., Haggerty, R. P., Yoon, W., Kriven, W. M., Knap, M. and Zschack, P. (2006) Rapid, In-Situ, Ultra-High Temperature Investigations of Ceramics using Synchrotron X-Ray Diffraction, in Mechanical Properties and Performance of Engineering Ceramics II: Ceramic Engineering and Science Proceedings, Volume 27, Issue 2 (eds R. Tandon, A. Wereszczak and E. Lara-Curzio), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470291313.ch30

Author Information

  1. 1

    Department of Materials Science and Engineering University of Illinois at Urbana–Champaign 1304 West Green Street, Urbana, IL 61801

  2. 2

    Institute for Materials Science, Darmstadt University of Technology Petersenstrasse 23, Darmstadt D–20146, Germany

  3. 3

    Advanced Photon Source, Argonne National Laboratory 9400 South Cass Avenue, Argonne, IL 60439

Publication History

  1. Published Online: 27 MAR 2008
  2. Published Print: 1 JAN 2006

ISBN Information

Print ISBN: 9780470080528

Online ISBN: 9780470291313

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Keywords:

  • curved image plate detector (CIPD);
  • high temperature x-ray diffraction (HTXRD);
  • deutsche elektronen-synchrotron (DESY);
  • curved image plate detector (CIPD);
  • argonne national laboratory (ANL)

Summary

A new Curved Image Plate Detector (CIPD) has been designed for X–ray diffraction investigations of ceramics using synchrotron radiation. It has been configured primarily for use with the Quadrupole Lamp Furnace (QLF), a thermal image furnace, which can be used to heat samples up to 2000 °C in air. The CIPD is a curved, one–dimensional detector which simultaneously records the entire diffraction pattern in the 20 range from 0° to 37°. An on–site reader enables extraction, transfer, and storage of X–ray intensity information in < 30 seconds. The CIPD shows narrow reflection half–widths and together with QLF has enabled rapid acquisition of high resolution X–ray diffraction patterns suitable for structural refinement. Selected results from high temperature X–ray diffraction studies using the CIPD+QLF setup are presented to demonstrate the potential of this setup for a variety of applications such as determination of true thermal expansion, or phase transformation behavior of materials, etc.