Chapter 33. Microstructural Characterization of a 2-D Woven Nicalon/SiC Ceramic Composite by Scanning Electron Microscopy Line-Scan Technique

  1. J. P. Singh
  1. Wei Zhao1,
  2. Peter K. Liaw1 and
  3. David C. Joy2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470294437.ch33

Proceedings of the 21st Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 18, Issue 3

Proceedings of the 21st Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 18, Issue 3

How to Cite

Zhao, W., Liaw, P. K. and Joy, D. C. (1997) Microstructural Characterization of a 2-D Woven Nicalon/SiC Ceramic Composite by Scanning Electron Microscopy Line-Scan Technique, in Proceedings of the 21st Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 18, Issue 3 (ed J. P. Singh), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294437.ch33

Author Information

  1. 1

    323 Dougherty Engineering Building, The University of Tennessee, 1512 Middle Drive, Knoxville, TN 37996

  2. 2

    232 Science and Engineering Research Facilities, The University of Tennessee, 1414 Circle Drive, Knoxville, TN 37996

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1997

ISBN Information

Print ISBN: 9780470375495

Online ISBN: 9780470294437

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