Chapter 45. The use of Secondary Ion Mass Spectrometry (Sims) in the Analysis of Alumina-Boria-Silica Ceramic

  1. J. P. Singh
  1. E. A. Leone1 and
  2. S. S. Campbell2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470294444.ch45

Proceedings of the 21st Annual Conference on Composites, Advanced Ceramics, Materials, and Structures - B: Ceramic Engineering and Science Proceedings, Volume 18, Issue 4

Proceedings of the 21st Annual Conference on Composites, Advanced Ceramics, Materials, and Structures - B: Ceramic Engineering and Science Proceedings, Volume 18, Issue 4

How to Cite

Leone, E. A. and Campbell, S. S. (1997) The use of Secondary Ion Mass Spectrometry (Sims) in the Analysis of Alumina-Boria-Silica Ceramic, in Proceedings of the 21st Annual Conference on Composites, Advanced Ceramics, Materials, and Structures - B: Ceramic Engineering and Science Proceedings, Volume 18, Issue 4 (ed J. P. Singh), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294444.ch45

Author Information

  1. 1

    Allied Signal Inc., 101 Columbia Road, Morristown, NJ 07962-1021

  2. 2

    Allied Signal Inc., 50 East Algonquin Road, Des Plaines, IL 60017-5016

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1997

ISBN Information

Print ISBN: 9780470375532

Online ISBN: 9780470294444

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Keywords:

  • concentration;
  • nitridation;
  • extensively;
  • insensitive;
  • characterizing

Summary

Thin flakes of Nextel™ 312 ceramic were nitrided under different conditions by systematically varying the time, temperature and ammonia concentration. A number of surface analytical techniques were used to study the surface chemistry of the treated samples. XPS and dynamic SIMS depth profiling analysis provided quantitative distributions of B, Al and Si as a function of depth. Static ToF-SIMS analysis definitively identified the in-situ deposited B-rich layer as BN. Differences in the BN distribution were observed when comparing film and weave samples. The concentration profiles from the SIMS analyses were used to develop a model of the nitridation process.