Chapter 56. Study of Grain Boundary Structure of Ceramics by Electron Backscattered Diffraction (EBSD) Analyses

  1. Don Bray
  1. Y. Yasutomi1,
  2. Y. Sakaida1,
  3. Y. Sawai2,
  4. Y. Ikuhara3 and
  5. T. Yamamoto3

Published Online: 26 MAR 2008

DOI: 10.1002/9780470294482.ch56

22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 19, Issue 3

22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 19, Issue 3

How to Cite

Yasutomi, Y., Sakaida, Y., Sawai, Y., Ikuhara, Y. and Yamamoto, T. (1988) Study of Grain Boundary Structure of Ceramics by Electron Backscattered Diffraction (EBSD) Analyses, in 22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 19, Issue 3 (ed D. Bray), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294482.ch56

Author Information

  1. 1

    Research and Development Laboratory, Japan Fine Ceramics Center, 2-4-1, Mutsuno, Atsuta-ku, Nagoya, 456 JAPAN

  2. 2

    Synergy Ceramic Laboratory, Fine Ceramics Research Association, 2-4-1, Mutsuno, Atsuta-ku, Nagoya, 456 JAPAN

  3. 3

    Department of Materials Science, The University of Tokyo, 7-3-1, Hongo, Bunkyo-ku, Tokyo, 113 JAPAN

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1988

ISBN Information

Print ISBN: 9780470375587

Online ISBN: 9780470294482

SEARCH

Keywords:

  • microscopy;
  • crystallographic;
  • electron;
  • hexagonal;
  • thermal

Summary

It is important to analyze the grain boundary structure because the crystallographic orientation of one grain matches the orientation of neighboring grains during the sintering process. In the present work, the in situ silicon nitride (Si3N4) composite is analyzed by the electron backscattered diffraction (EBSD) method using field emission-scanning electron microscopy (FE-SEM: JSM-6330F, JEOL) with an orientation imaging microscopy analysis device (TSL, Inc.). The following results were obtained: 1) Si3N4 ceramics of hexagonal structure was successfully analyzed by the EBSD method. 2) Elongated Si3N4 particles grew vertically in the alignment direction of seed grains. 3) Growth direction and side planes of the elongated Si3N4 particles are influenced by alignment of seed grains and the hot pressing pressure. 4) It is important to analyze microstructure during the sintering stage in order to improve thermal conductivity and mechanical properties of in situ Si3N4 composite.