Chapter 56. Microstructure — Electrical Transport Correlation in Ceramic Oxide Thin Films

  1. Don Bray
  1. Igor Kosacki and
  2. Harlan U. Anderson

Published Online: 23 MAR 2010

DOI: 10.1002/9780470294499.ch56

22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: B: Ceramic Engineering and Science Proceedings, Volume 19, Issue 4

22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: B: Ceramic Engineering and Science Proceedings, Volume 19, Issue 4

How to Cite

Kosacki, I. and Anderson, H. U. (1998) Microstructure — Electrical Transport Correlation in Ceramic Oxide Thin Films, in 22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: B: Ceramic Engineering and Science Proceedings, Volume 19, Issue 4 (ed D. Bray), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294499.ch56

Author Information

  1. Department of Ceramic Engineering, University of Missouri-Rolla, MO 65401, USA

Publication History

  1. Published Online: 23 MAR 2010
  2. Published Print: 1 JAN 1998

ISBN Information

Print ISBN: 9780470375594

Online ISBN: 9780470294499

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