Chapter 17. The Growth and Structure of Nanocrystalline ZrO2:Y Thin Films

  1. Ersan Ustundag and
  2. Gary Fischman
  1. Igor Kosacki,
  2. Mark Shumsky and
  3. Harlan U. Anderson

Published Online: 26 MAR 2008

DOI: 10.1002/9780470294567.ch17

23rd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures : A: Ceramic Engineering and Science Proceedings, Volume 20, Issue 3

23rd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures : A: Ceramic Engineering and Science Proceedings, Volume 20, Issue 3

How to Cite

Kosacki, I., Shumsky, M. and Anderson, H. U. (2008) The Growth and Structure of Nanocrystalline ZrO2:Y Thin Films, in 23rd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures : A: Ceramic Engineering and Science Proceedings, Volume 20, Issue 3 (eds E. Ustundag and G. Fischman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294567.ch17

Author Information

  1. Electronic Materials Research Center, University of Missouri-Rolla, MO 65401

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1999

ISBN Information

Print ISBN: 9780470375631

Online ISBN: 9780470294567

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Keywords:

  • microstructure;
  • quantum confinement;
  • catalytic;
  • electrolytes;
  • interfacial

Summary

The results of studies of the preparation and structure of ZrO2:16%Y thin films are presented. Dense films with 1–300nm grain size have been obtained on polycrystalline Al2O3 and monocrystal sapphire substrates using a polymeric precursor spin coating technique. The relationship between the microstructure and processing parameters has been determined and discussed. The results of Raman scattering and optical absorption are presented and correlated with the microstructure of ZrO2:16%Y thin films. The quantum confinement effects were observed for the grain size smaller than 100nm.