Chapter 20. Evaluation of Creep Property of As800 Silicon Nitride from Asprocessed Surface Regions

  1. Mrityunjay Singh and
  2. Todd Jessen
  1. H. T. Lin1,
  2. S. B. Waters1,
  3. K. L. More1,
  4. J. Wimmer2 and
  5. C. W. Li2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470294680.ch20

25th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 22, Issue 3

25th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 22, Issue 3

How to Cite

Lin, H. T., Waters, S. B., More, K. L., Wimmer, J. and Li, C. W. (2001) Evaluation of Creep Property of As800 Silicon Nitride from Asprocessed Surface Regions, in 25th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 22, Issue 3 (eds M. Singh and T. Jessen), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294680.ch20

Author Information

  1. 1

    Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831–6068

  2. 2

    Honeywell Ceramic Components, Torrance, CA 90504

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 2001

ISBN Information

Print ISBN: 9780470375730

Online ISBN: 9780470294680

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