Chapter 21. On the Mechanism of High Temperature Strength Degradation of Low-Doped Hiped Silicon Nitride by In-Depth Tem-Sem Investigation

  1. Mrityunjay Singh and
  2. Todd Jessen
  1. Robert Pompe1,
  2. Kazushi Kishi2,
  3. Mats Halvarsson3 and
  4. Robert Lundberg4

Published Online: 26 MAR 2008

DOI: 10.1002/9780470294680.ch21

25th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 22, Issue 3

25th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 22, Issue 3

How to Cite

Pompe, R., Kishi, K., Halvarsson, M. and Lundberg, R. (2001) On the Mechanism of High Temperature Strength Degradation of Low-Doped Hiped Silicon Nitride by In-Depth Tem-Sem Investigation, in 25th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings, Volume 22, Issue 3 (eds M. Singh and T. Jessen), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294680.ch21

Author Information

  1. 1

    Swedish Ceramic Institute Box 5403 SE-402 29 Göteborg, Sweden

  2. 2

    National Industrial Research Institute Kyushu, Tosu-shi Saga-ken, 841–0052 Japan

  3. 3

    Department of Experimental Physics Chalmers University of Technology and Göteborg University SE-412 96 Goteborg, Sweden

  4. 4

    Volvo Aero Corporation SE-461 81 Trolhättan, Sweden

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 2001

ISBN Information

Print ISBN: 9780470375730

Online ISBN: 9780470294680

SEARCH

Options for accessing this content:

  • If you have access to this content through a society membership, please first log in to your society website.
  • Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
  • You can purchase online access to this Chapter for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Login via OpenAthens

or

Search for your institution's name below to login via Shibboleth.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >