Chapter 49. Electrical Conductivity of Nanocrystalline Sm-Doped Ceo2 Thin Film

  1. Waltraud M. Kriven and
  2. Hua-Tay Lin
  1. Toshio Suzuki,
  2. Piotr Jasinski and
  3. Harlan U. Anderson

Published Online: 27 MAR 2008

DOI: 10.1002/9780470294802.ch49

27th Annual Cocoa Beach Conference on Advanced Ceramics and Composites: A: Ceramic Engineering and Science Proceedings, Volume 24, Issue 3

27th Annual Cocoa Beach Conference on Advanced Ceramics and Composites: A: Ceramic Engineering and Science Proceedings, Volume 24, Issue 3

How to Cite

Suzuki, T., Jasinski, P. and Anderson, H. U. (2003) Electrical Conductivity of Nanocrystalline Sm-Doped Ceo2 Thin Film, in 27th Annual Cocoa Beach Conference on Advanced Ceramics and Composites: A: Ceramic Engineering and Science Proceedings, Volume 24, Issue 3 (eds W. M. Kriven and H.-T. Lin), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294802.ch49

Author Information

  1. EMARC, University of Missouri-Rolla, 303 MRC, Rolla, MO 65401 USA

Publication History

  1. Published Online: 27 MAR 2008
  2. Published Print: 1 JAN 2003

ISBN Information

Print ISBN: 9780470375839

Online ISBN: 9780470294802

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Keywords:

  • yttria-stabilized zirconia;
  • resonant ultrasound spectroscopy;
  • solid state energy conversion alliance;
  • impulse excitation;
  • biaxial testing

Summary

Dense, nanocrystalline films of 20mol%Sm-doped CeO2 (SDC20) on sapphire substrates and bulk samples were prepared using a polymeric precursor. The electrical conductivity was studied as a function of temperature and correlated with the grain size (dg). The brick layer model predicted that the total conductivity should decrease with decreasing grain when the grain boundary resistivity is higher than that of grain. The experimental data followed this model except when dg<15 nm where it was observed that the total conductivity increased as the grain size decreased, which suggested a reduction of the grain boundary resistivity. This is postulated to result from a decrease in impurity concentration due to increases in the volume of the grain boundary region.