Chapter 74. Recent Developments in the Characterization of Anisotropic Void Populations in Thermal Barrier Coatings Using Ultra-Small Angle X-Ray Scattering

  1. Waltraud M. Kriven and
  2. Hua-Tay Lin
  1. T. A. Dobbins1,
  2. A. J. Allen1,
  3. J. Ilavsky1,
  4. G. G. Long1 and
  5. P. R. Jemian2

Published Online: 27 MAR 2008

DOI: 10.1002/9780470294802.ch74

27th Annual Cocoa Beach Conference on Advanced Ceramics and Composites: A: Ceramic Engineering and Science Proceedings, Volume 24, Issue 3

27th Annual Cocoa Beach Conference on Advanced Ceramics and Composites: A: Ceramic Engineering and Science Proceedings, Volume 24, Issue 3

How to Cite

Dobbins, T. A., Allen, A. J., Ilavsky, J., Long, G. G. and Jemian, P. R. (2003) Recent Developments in the Characterization of Anisotropic Void Populations in Thermal Barrier Coatings Using Ultra-Small Angle X-Ray Scattering, in 27th Annual Cocoa Beach Conference on Advanced Ceramics and Composites: A: Ceramic Engineering and Science Proceedings, Volume 24, Issue 3 (eds W. M. Kriven and H.-T. Lin), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470294802.ch74

Author Information

  1. 1

    Ceramics Division National Institute of Standards and Technology Gaithersburg, MD 20899-8520

  2. 2

    rederick Seitz Materials Research Laboratory University of Illionois at Urbana-Champaign Urbana, IL 61801 Dept. of Chemical Engineering Purdue University West Lafayette, in 47907

Publication History

  1. Published Online: 27 MAR 2008
  2. Published Print: 1 JAN 2003

ISBN Information

Print ISBN: 9780470375839

Online ISBN: 9780470294802

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Keywords:

  • thermal barrier coatings;
  • electron energy loss spectroscopy;
  • energy dispersive spectroscopy;
  • selected area diffraction;
  • gatan image filter

Summary

Thermal barrier coatings (TBC) have complex void microstructures which control their in-service properties. in the research reported here, ultra-small-angle x-ray scattering (USAXS) has been used to characterize anisotropic void populations in TBC's. A new analysis method has been developed for characterizing the voids in three dimensions. The anisotropy in the microstructure at a given length scale associated with a value of the scattering vector, |Q| gives rise to changes in scattered intensity as a function of the sample orientation. by measuring the scattered intensity at fixed |Q| as the sample is rotated about the beam, the distribution of the scattering population(s) at this length scale is determined. Using an anisotropic modeling method, the void orientation distribution, void size distribution, shape, volume fraction information is determined for up to four different void populations. This paper illustrates the use of three-dimensional anisotropic USAXS modeling for the analysis of scattering from voids in TBC microstructures deposited by electron beam physical vapor deposition.