Chapter 54. AES Study of Composition and Microstructure of SiC Sintered with Rare Earth Oxides

  1. John B. Wachtman Jr.
  1. R. L. Moore1 and
  2. L. Cordrey2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470310557.ch54

A Collection of Papers Presented at the 13th Annual Conference on Composites and Advanced Ceramic Materials, Part 1 of 2: Ceramic Engineering and Science Proceedings, Volume 10, Issue 7/8

A Collection of Papers Presented at the 13th Annual Conference on Composites and Advanced Ceramic Materials, Part 1 of 2: Ceramic Engineering and Science Proceedings, Volume 10, Issue 7/8

How to Cite

Moore, R. L. and Cordrey, L. (1989) AES Study of Composition and Microstructure of SiC Sintered with Rare Earth Oxides, in A Collection of Papers Presented at the 13th Annual Conference on Composites and Advanced Ceramic Materials, Part 1 of 2: Ceramic Engineering and Science Proceedings, Volume 10, Issue 7/8 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470310557.ch54

Author Information

  1. 1

    Perkin-Elmer 5 Progress St. Edison, NJ 08820

  2. 2

    Rutgers University Ceramic Engineering Department Piscataway, NJ 08854

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1989

ISBN Information

Print ISBN: 9780470374863

Online ISBN: 9780470310557

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Keywords:

  • secondary electron imaging;
  • ceramists;
  • auger analysis;
  • chemical vapor infiltration;
  • stoichiometric oxides

Summary

For any ceramic part to be intrinsically strong it must be dense, free from inclusions and large agglomerates, and have uniform microstructure. It is therefore necessary to 1) control the processing to minimize flaw-inducing sources and 2) fully characterize the end material in order to assess the efficacy of the aforementioned efforts. This work will evaluate the addition of rare earth oxides as densifiers to silicon carbide. One system in particular, yttria and alumina, will be examined in depth. High resolution scanning Auger spectroscopy and secondary electron microscopy are utilized to characterize the distribution and composition of the second phase additions in the sintered compact. Micrographs and AES spectra of grain boundaries and three-grain junctions will also be presented and discussed.