Chapter 14. Effect of Convolution Kernels on 3-D X-Ray CT Image Quality for Characterization of Ceramics

  1. John B. Wachtman Jr.
  1. K. Gopalan1,
  2. T. I. Hentea1 and
  3. W. A. Ellingson2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470313053.ch14

14th Annual Conference on Composites and Advanced Ceramic Materials, Part 2 of 2: Ceramic Engineering and Science Proceedings, Volume 11, Issue 9/10

14th Annual Conference on Composites and Advanced Ceramic Materials, Part 2 of 2: Ceramic Engineering and Science Proceedings, Volume 11, Issue 9/10

How to Cite

Gopalan, K., Hentea, T. I. and Ellingson, W. A. (1990) Effect of Convolution Kernels on 3-D X-Ray CT Image Quality for Characterization of Ceramics, in 14th Annual Conference on Composites and Advanced Ceramic Materials, Part 2 of 2: Ceramic Engineering and Science Proceedings, Volume 11, Issue 9/10 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470313053.ch14

Author Information

  1. 1

    Electrical Engineering Department, Purdue University Calumet Campus, Hammond, IN

  2. 2

    Argonne National Laboratory, Argonne, IL

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1990

ISBN Information

Print ISBN: 9780470374931

Online ISBN: 9780470313053

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Keywords:

  • tomographic;
  • microfocus;
  • parameter;
  • algorithm;
  • sensitometer

Summary

X-ray computed tomographic imaging is gaining widespread application for nondestructive evaluation and characterization of advanced structural ceramic materials. Since the quality of the X-ray CT image depends on the convolution kernel used, it is important to choose an appropriate kernel for accurate measurement of parameters such as the density distribution and organic content in the specimen. This paper presents a description of microfocus 3-D X-ray tomographic imaging and shows the effect of kernels on the reconstructed images in making parameter measurement.