Chapter 50. In Situ X-Ray Monitoring of Damage Accumulation in SiC/RBSN Tensile Specimens

  1. John B. Wachtman Jr
  1. George Y. Baaklini and
  2. Ramkrishna T. Bhatt

Published Online: 28 MAR 2008

DOI: 10.1002/9780470313831.ch50

Proceedings of the 15th Annual Conference on Composites and Advanced Ceramic Materials, Part 1 of 2: Ceramic Engineering and Science Proceedings, Volume 12, Issue 7/8

Proceedings of the 15th Annual Conference on Composites and Advanced Ceramic Materials, Part 1 of 2: Ceramic Engineering and Science Proceedings, Volume 12, Issue 7/8

How to Cite

Baaklini, G. Y. and Bhatt, R. T. (1991) In Situ X-Ray Monitoring of Damage Accumulation in SiC/RBSN Tensile Specimens, in Proceedings of the 15th Annual Conference on Composites and Advanced Ceramic Materials, Part 1 of 2: Ceramic Engineering and Science Proceedings, Volume 12, Issue 7/8 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470313831.ch50

Author Information

  1. NASA Lewis Research Center Cleveland, OH 44135

Publication History

  1. Published Online: 28 MAR 2008
  2. Published Print: 1 JAN 1991

ISBN Information

Print ISBN: 9780470375099

Online ISBN: 9780470313831

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