Chapter 36. SIMS-Auger and Thermal Conductivity Characterization of Si-SiC Materials
- John B. Wachtman Jr.
Published Online: 26 MAR 2008
Copyright © 1992 The American Ceramics Society
Proceedings of the 16th Annual Conference on Composites and Advanced Ceramic Materials, Part 2 of 2: Ceramic Engineering and Science Proceedings, Volume 13, Issue 9/10
How to Cite
Scafè, E., Grillo, G., Fabbri, L. and Vittori, V. (1994) SIMS-Auger and Thermal Conductivity Characterization of Si-SiC Materials, in Proceedings of the 16th Annual Conference on Composites and Advanced Ceramic Materials, Part 2 of 2: Ceramic Engineering and Science Proceedings, Volume 13, Issue 9/10 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470313978.ch36
- Published Online: 26 MAR 2008
- Published Print: 1 JAN 1994
Print ISBN: 9780470375198
Online ISBN: 9780470313978
SiC ceramics composites have potential application in heat exchangers due to their high thermal conductivity. In order to correlate the effect of processing on the heat transfer properties, analyses by Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES) were performed. The impurity content obtained by SIMS-AES techniques was correlated with thermal conductivity, determined by the laser-flash method. Measurements were performed on commercial SiC-based ceramics as well as on Si-SiC composite materials prepared in controlled conditions. The role of transition elements is discussed.