Chapter 2. Advantages of the Use of the Purdue Methodology in Developing CIM Systems for Industrial Plants of All Types

  1. John B. Wachtman Jr
  1. Theodore J. Williams

Published Online: 26 MAR 2008

DOI: 10.1002/9780470314098.ch2

A Collection of Papers Presented at the 53nd Conference on Glass Problems: Ceramic Engineering and Science Proceedings, Volume 14, Issue 3/4

A Collection of Papers Presented at the 53nd Conference on Glass Problems: Ceramic Engineering and Science Proceedings, Volume 14, Issue 3/4

How to Cite

Williams, T. J. (1993) Advantages of the Use of the Purdue Methodology in Developing CIM Systems for Industrial Plants of All Types, in A Collection of Papers Presented at the 53nd Conference on Glass Problems: Ceramic Engineering and Science Proceedings, Volume 14, Issue 3/4 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470314098.ch2

Author Information

  1. Purdue Laboratory for Applied Industrial Control Purdue University West Lafayette, IN 47907

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1993

ISBN Information

Print ISBN: 9780470375242

Online ISBN: 9780470314098

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Keywords:

  • methodology;
  • architeciure;
  • disappointing;
  • optimality;
  • potential

Summary

Over the past three years the Purdue Laboratory for Applied Industrial Control, in conjunction with an industrial consortium of 10 companies, has prepared a planning guide for developing CIM systems programs for manufacturing companies in any and all industries. This work was enabled by the concurrent development of the Purdue enterprise reference architecture for modeling the industrial plants involved. These, combined with an earlier document, the Purdue reference model for CIM, make up the Purdue methodology noted in the title. This paper discusses these documents and their importance to the future development of CIM systems. The reference architecture in particular holds special promise as a tool for further research in CIM systems technology. This will also be discussed.