Chapter 33. Determining the Crystal Phases in Ceramic Pigments by X-Ray Diffraction Analysis

  1. John B. Wachtman Jr.
  1. Douglas R. Eppler and
  2. Richard A. Eppler

Published Online: 26 MAR 2008

DOI: 10.1002/9780470314340.ch33

A Collection of Papers Presented at the 95th Annual Meeting and the 1993 Fall Meeting of the Materials & Equipment/Whitewares/Manufacturing: Ceramic Engineering and Science Proceedings, Volume 15, Issue 1

A Collection of Papers Presented at the 95th Annual Meeting and the 1993 Fall Meeting of the Materials & Equipment/Whitewares/Manufacturing: Ceramic Engineering and Science Proceedings, Volume 15, Issue 1

How to Cite

Eppler, D. R. and Eppler, R. A. (2008) Determining the Crystal Phases in Ceramic Pigments by X-Ray Diffraction Analysis, in A Collection of Papers Presented at the 95th Annual Meeting and the 1993 Fall Meeting of the Materials & Equipment/Whitewares/Manufacturing: Ceramic Engineering and Science Proceedings, Volume 15, Issue 1 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470314340.ch33

Author Information

  1. Eppler Associates Cheshire, CT 06410

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1994

ISBN Information

Print ISBN: 9780470375297

Online ISBN: 9780470314340

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Keywords:

  • ceramic;
  • processing;
  • diffraction;
  • concentrations;
  • geologic

Summary

The minor phases present in a ceramic pigment are often important to the pigment properties. By adapting computer techniques developed for signal processing an improved analysis of the phases present in a pigment can be made.