Chapter 3. High-Resolution Electron Microscopy of Precycled Samples of a Sintered Silicon Nitride
- John B. Wachtman Jr.
Published Online: 28 MAR 2008
Copyright © 1994 The American Ceramic Society
Proceedings of the 18th Annual Conference on Composites and Advanced Ceramic Materials - B: Ceramic Engineering and Science Proceedings, Volume 15, Issue 5
How to Cite
Neogi, J., Neogi, S. S., Sankar, J. and Vaidyanathan, R. (1994) High-Resolution Electron Microscopy of Precycled Samples of a Sintered Silicon Nitride, in Proceedings of the 18th Annual Conference on Composites and Advanced Ceramic Materials - B: Ceramic Engineering and Science Proceedings, Volume 15, Issue 5 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470314555.ch3
- Published Online: 28 MAR 2008
- Published Print: 1 JAN 1994
Print ISBN: 9780470375334
Online ISBN: 9780470314555
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