Chapter 3. High-Resolution Electron Microscopy of Precycled Samples of a Sintered Silicon Nitride

  1. John B. Wachtman Jr.
  1. Jayant Neogi,
  2. Suneeta S. Neogi,
  3. Jag Sankar and
  4. Ranji Vaidyanathan

Published Online: 28 MAR 2008

DOI: 10.1002/9780470314555.ch3

Proceedings of the 18th Annual Conference on Composites and Advanced Ceramic Materials - B: Ceramic Engineering and Science Proceedings, Volume 15, Issue 5

Proceedings of the 18th Annual Conference on Composites and Advanced Ceramic Materials - B: Ceramic Engineering and Science Proceedings, Volume 15, Issue 5

How to Cite

Neogi, J., Neogi, S. S., Sankar, J. and Vaidyanathan, R. (1994) High-Resolution Electron Microscopy of Precycled Samples of a Sintered Silicon Nitride, in Proceedings of the 18th Annual Conference on Composites and Advanced Ceramic Materials - B: Ceramic Engineering and Science Proceedings, Volume 15, Issue 5 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470314555.ch3

Author Information

  1. Department of Mechanical Engineering, North Carolina A&T State University, Greensboro, NC 27411

Publication History

  1. Published Online: 28 MAR 2008
  2. Published Print: 1 JAN 1994

ISBN Information

Print ISBN: 9780470375334

Online ISBN: 9780470314555

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