Chapter 40. Microstructural Evaluation of Deformation Mechanisms in Silicon Nitride Ceramics

  1. John B. Wachtman Jr.
  1. J. A. Schneider and
  2. A. K. Mukherjee

Published Online: 26 MAR 2008

DOI: 10.1002/9780470314821.ch40

Proceedings of the 20th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures - A: Ceramic Engineering and Science Proceedings, Volume 17, Issue 3

Proceedings of the 20th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures - A: Ceramic Engineering and Science Proceedings, Volume 17, Issue 3

How to Cite

Schneider, J. A. and Mukherjee, A. K. (1996) Microstructural Evaluation of Deformation Mechanisms in Silicon Nitride Ceramics, in Proceedings of the 20th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures - A: Ceramic Engineering and Science Proceedings, Volume 17, Issue 3 (ed J. B. Wachtman), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470314821.ch40

Author Information

  1. Department of Chemical and Material Science, Engineering University of California, Davis, Davis, California 95616

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1996

ISBN Information

Print ISBN: 9780470375426

Online ISBN: 9780470314821

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Keywords:

  • deformation;
  • consolidated;
  • transforming;
  • stoichiometric standards;
  • discontinuity

Summary

Changes of phase composition and chemistry during deformation testing in compression of silicon nitride were investigated. The specimens were rapidly consolidated to maintain the initial alpha phase. In initial compressive deformation testing, 70% true strain was achieved at strain rates of 5 × 10−6 s−1 . Phase transformation was noted to occur during compressive deformation testing over the range of temperatures investigated. Grain boundary chemistry was determined with a JEOL 200 CX Analytical Electron Microscope (AEM) and an 8OOO KEVEX System. The phase compositions of individual silicon nitride grains were determined by indexing of electron beam diffraction patterns.