4. Two Factors, Etch at Three Levels

  1. Cuthbert Daniel

Published Online: 4 APR 2011

DOI: 10.1002/9780470316467.ch4

Applications of Statistics to Industrial Experimentation

Applications of Statistics to Industrial Experimentation

How to Cite

Daniel, C. (1976) Two Factors, Etch at Three Levels, in Applications of Statistics to Industrial Experimentation, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470316467.ch4

Publication History

  1. Published Online: 4 APR 2011
  2. Published Print: 9 JUN 1976

ISBN Information

Print ISBN: 9780471194699

Online ISBN: 9780470316467

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Keywords:

  • applied mathematicians;
  • secon-order equation;
  • physical model;
  • taylor series expansion;
  • secon-order rotatability

Summary

The prelims comprise:

  • Introduction

  • Both factors have numerically scaled levels

  • Standard computations in a 32

  • One-cell interaction

  • Simpler interpretation of ALBα, AσBL

  • Tukey's test for multiplicative nonadditivity

  • An eyeball test for interaction

  • What is the answer? (What is the question?)

  • An tinreplicated 3′ on air-pollution data

  • The 32 with both factors discontinuous

  • The 32 with one factor-continuous, one discrete-leveled

  • Summary