7. Competing Failure Modes and Size Effect

  1. Wayne Nelson

Published Online: 27 MAY 2008

DOI: 10.1002/9780470316795.ch7

Accelerated Testing: Statistical Models, Test Plans, and Data Analysis

Accelerated Testing: Statistical Models, Test Plans, and Data Analysis

How to Cite

Nelson, W. (1990) Competing Failure Modes and Size Effect, in Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470316795.ch7

Author Information

  1. Consultant, Schenectady, NY

Publication History

  1. Published Online: 27 MAY 2008
  2. Published Print: 2 FEB 1990

ISBN Information

Print ISBN: 9780471522775

Online ISBN: 9780470316795

SEARCH

Keywords:

  • semiconductor device;
  • ground insulation;
  • competing failure modes;
  • fatigue specimens;
  • design stress

Summary

The prelims comprise:

  • Series-System Model

  • Series Systems of Identical Parts

  • Size Effect

  • Nonuniform Stress

  • Graphical Analysis

  • ML Analysis for Competing Failure Modes

  • ML Theory for Competing Modes