Chapter 7. Review of Static Fatigue in Silicon Nitride and Silicon Carbide

  1. William Smothers
  1. G. D. Quinn

Published Online: 26 MAR 2008

DOI: 10.1002/9780470318140.ch7

A Collection of Papers Presented at the 1981 New England Section Topical Meeting on Nonoxide Ceramics: Ceramic Engineering and Science Proceedings, Volume 3, No. 1/2

A Collection of Papers Presented at the 1981 New England Section Topical Meeting on Nonoxide Ceramics: Ceramic Engineering and Science Proceedings, Volume 3, No. 1/2

How to Cite

Quinn, G. D. (1982) Review of Static Fatigue in Silicon Nitride and Silicon Carbide, in A Collection of Papers Presented at the 1981 New England Section Topical Meeting on Nonoxide Ceramics: Ceramic Engineering and Science Proceedings, Volume 3, No. 1/2 (ed W. Smothers), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470318140.ch7

Author Information

  1. U.S. Army Materials and Mechanics Research Center Watertown, MA 02172

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1982

ISBN Information

Print ISBN: 9780470373934

Online ISBN: 9780470318140

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Keywords:

  • phenomena;
  • dynamic;
  • atmosphere;
  • mechanics;
  • impurities

Summary

Silicon-based ceramics are susceptible to static fatigue. Stress-rupture testing is the most reliable method of detecting static fatigue phenomena in ceramics. Stress-rupture results for a variety of silicon nitrides and carbides are reviewed. Static fatigue resistance at high temperature depends largely on grain-boundary chemistry, environment, and surface connected porosity if present. Distinction is made between stress corrosion, creep rupture, and slow crack growth of preexisting flaws. Special emphasis is devoted to hot-pressed silicon nitride for which the greatest body of data exists.