Chapter 1. The A. I. Andrews Memorial Lecture: Modern Methods of Materials Analysis

  1. William Smothers
  1. Wendell S. Williams

Published Online: 26 MAR 2008

DOI: 10.1002/9780470318836.ch1

Proceedings of the 44th Porcelain Enamel Institute Technical Forum: Ceramic Engineering and Science Proceedings, Volume 4, Issue 5/6

Proceedings of the 44th Porcelain Enamel Institute Technical Forum: Ceramic Engineering and Science Proceedings, Volume 4, Issue 5/6

How to Cite

Smothers, W. (1983) The A. I. Andrews Memorial Lecture: Modern Methods of Materials Analysis, in Proceedings of the 44th Porcelain Enamel Institute Technical Forum: Ceramic Engineering and Science Proceedings, Volume 4, Issue 5/6, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470318836.ch1

Author Information

  1. Dept. of Ceramic Engineering and Dept. of Physics University of Illinois at Urbana-Champaign, Urbana, IL 61801

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1983

ISBN Information

Print ISBN: 9780470374023

Online ISBN: 9780470318836

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Keywords:

  • microscopy;
  • diffraction;
  • resolution;
  • laboratory;
  • spatial

Summary

The techniques of scanning electron microscopy, energy-dispersive X-ray analysis, transmission electron microscopy, electron diffraction, electron energy-loss spec-troscopy, and Auger electron spectroscopy are discussed as means for analyzing coating/metal interfaces, precipitates, and grain-boundary phases. Examples are drawn from systems involving cobalt, nickel, titanium, tungsten, carbon, and boron.