Chapter 19. Process Control for Screen Analysis Using Chi-Square and T-Square Charts

  1. William Smothers
  1. D. S. Holmes1 and
  2. R. A. Zook2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470320365.ch19

Materials & Equipment/Whitewares: Ceramic Engineering and Science Proceedings, Volume 7, Issue 11/12

Materials & Equipment/Whitewares: Ceramic Engineering and Science Proceedings, Volume 7, Issue 11/12

How to Cite

Holmes, D. S. and Zook, R. A. (2008) Process Control for Screen Analysis Using Chi-Square and T-Square Charts, in Materials & Equipment/Whitewares: Ceramic Engineering and Science Proceedings, Volume 7, Issue 11/12 (ed W. Smothers), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470320365.ch19

Author Information

  1. 1

    Stochos, Inc., 14 N. College St. Schenectady, NY 12308

  2. 2

    North American Refractories Co. 3217 Research Dr., State College, PA 16801

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1986

ISBN Information

Print ISBN: 9780470374696

Online ISBN: 9780470320365

SEARCH

Options for accessing this content:

  • If you have access to this content through a society membership, please first log in to your society website.
  • Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
  • You can purchase online access to this Chapter for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Type your institution's name in the box below. If your institution is a Wiley customer, it will appear in the list of suggested institutions and you will be able to log in to access content. Some users may also log in directly via OpenAthens.

Please note that there are currently a number of duplicate entries in the list of institutions. We are actively working on fixing this issue and apologize for any inconvenience caused.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >