Chapter 19. Process Control for Screen Analysis Using Chi-Square and T-Square Charts

  1. William Smothers
  1. D. S. Holmes1 and
  2. R. A. Zook2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470320365.ch19

Materials & Equipment/Whitewares: Ceramic Engineering and Science Proceedings, Volume 7, Issue 11/12

Materials & Equipment/Whitewares: Ceramic Engineering and Science Proceedings, Volume 7, Issue 11/12

How to Cite

Holmes, D. S. and Zook, R. A. (1986) Process Control for Screen Analysis Using Chi-Square and T-Square Charts, in Materials & Equipment/Whitewares: Ceramic Engineering and Science Proceedings, Volume 7, Issue 11/12 (ed W. Smothers), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470320365.ch19

Author Information

  1. 1

    Stochos, Inc., 14 N. College St. Schenectady, NY 12308

  2. 2

    North American Refractories Co. 3217 Research Dr., State College, PA 16801

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1986

ISBN Information

Print ISBN: 9780470374696

Online ISBN: 9780470320365

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Keywords:

  • analysis;
  • fractions;
  • variable;
  • disparity;
  • chi-square chart

Summary

The purpose of this paper is to describe statistical process control (SPC) charts which can be used to overcome the problems involved in process control for screen analysis.