Chapter 5. Characterization of Advanced Ceramics by Thermal Wave Imaging
- William Smothers
Published Online: 26 MAR 2008
Copyright © 1987 The American Ceramic Society, Inc.
11th Annual Conference on Composites and Advanced Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 8, Issue 7/8
How to Cite
Rose, D. N., Bryk, D. C., Jackson, W., Chaika, M., Schram, G., Quay, G., Thomas, R. L., Favro, L. D. and Kuo, P.-K. (1987) Characterization of Advanced Ceramics by Thermal Wave Imaging, in 11th Annual Conference on Composites and Advanced Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 8, Issue 7/8 (ed W. Smothers), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470320402.ch5
- Published Online: 26 MAR 2008
- Published Print: 1 JAN 1987
Print ISBN: 9780470374733
Online ISBN: 9780470320402
- thermal wave imaging;
- photoacoustic microscopy;
- scanning laser acoustic microscope(SLAM);
- CVD sic coating
Thermal wave imaging, also known as photoacoustic microscopy, gives a view of a material's thermal properties. Detection of tight vertical cracks in hot pressed silicon nitride is shown. Images are given demonstrating resolution down to 1 μm on a chemical vapor deposited silicon carbide coating on graphite. An application of thermal wave imaging to a suspected spall region on a sintered silicon nitride wristpin is shown.