Chapter 5. Characterization of Advanced Ceramics by Thermal Wave Imaging

  1. William Smothers
  1. Douglas N. Rose1,
  2. Darryl C. Bryk1,
  3. William Jackson1,
  4. Milt Chaika1,
  5. Glen Schram1,
  6. Greg Quay1,
  7. Robert L. Thomas2,
  8. Lawrence D. Favro2 and
  9. Pao-Kuang Kuo2

Published Online: 26 MAR 2008

DOI: 10.1002/9780470320402.ch5

11th Annual Conference on Composites and Advanced Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 8, Issue 7/8

11th Annual Conference on Composites and Advanced Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 8, Issue 7/8

How to Cite

Rose, D. N., Bryk, D. C., Jackson, W., Chaika, M., Schram, G., Quay, G., Thomas, R. L., Favro, L. D. and Kuo, P.-K. (1987) Characterization of Advanced Ceramics by Thermal Wave Imaging, in 11th Annual Conference on Composites and Advanced Ceramic Materials: Ceramic Engineering and Science Proceedings, Volume 8, Issue 7/8 (ed W. Smothers), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470320402.ch5

Author Information

  1. 1

    U. S. Army Tank Automotive Command Warren, MI 48397–5000

  2. 2

    Wayne State Univ. Detroit, MI 48202

Publication History

  1. Published Online: 26 MAR 2008
  2. Published Print: 1 JAN 1987

ISBN Information

Print ISBN: 9780470374733

Online ISBN: 9780470320402

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Keywords:

  • thermal wave imaging;
  • photoacoustic microscopy;
  • HPSN;
  • scanning laser acoustic microscope(SLAM);
  • CVD sic coating

Summary

Thermal wave imaging, also known as photoacoustic microscopy, gives a view of a material's thermal properties. Detection of tight vertical cracks in hot pressed silicon nitride is shown. Images are given demonstrating resolution down to 1 μm on a chemical vapor deposited silicon carbide coating on graphite. An application of thermal wave imaging to a suspected spall region on a sintered silicon nitride wristpin is shown.